X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge

• Carla Bittencourt,
• Adam P. Hitchock,
• Xiaoxing Ke,
• Gustaaf Van Tendeloo,
• Chris P. Ewels and
• Peter Guttmann

Beilstein J. Nanotechnol. 2012, 3, 345–350, doi:10.3762/bjnano.3.39